| 2012 | Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons. | Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi |
| 2012 | Fault missing rate analysis of the arithmetic residue codes based fault-tolerant FIR filter design. | Zhen Gao, Wenhui Yang, Xiang Chen, Ming Zhao, Jing Wang |
| 2012 | Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports. | Francisco R. Fernandes, Ricardo J. Machado, Jos M. Ferreira, Manuel G. Gericota |
| 2012 | RIIF - Reliability information interchange format. | Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro |
| 2012 | Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster. | Arwa Ben Dhia, Lirida A. B. Naviner, Philippe Matherat |
| 2012 | Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. | Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee |
| 2012 | An efficient probability framework for error propagation and correlation estimation. | Liang Chen, Mehdi Baradaran Tahoori |
| 2012 | Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors. | Ameya Chaudhari, Jacob A. Abraham |
| 2012 | Do more camera pixels result in a better picture? | Glenn H. Chapman, Israel Koren, Zahava Koren |
| 2012 | Functional level embedded self testing for Walsh transform based adaptive hardware. | Ariel Burg, Osnat Keren |
| 2012 | A fault attack robust TRNG. | Eberhard Bhl, Markus Ihle |
| 2012 | Relation between HCI-induced performance degradation and applications in a RISC processor. | Clement Bertolini, Olivier Hron, Nicolas Ventroux, Franois Marc |
| 2012 | SEU-X: A SEu un-excitability prover for SRAM-FPGAs. | Cinzia Bernardeschi, Luca Cassano, Andrea Domenici |
| 2012 | Event-driven on-line co-simulation with fault diagnostic. | Mikhail Baklashov |
| 2012 | Analysis of FinFET technology on memories. | Esteve Amat, A. Asenov, Ramon Canal, Binjie Cheng, J.-Ll. Cruz, Zoran Jaksic, Miguel Miranda, Antonio Rubio, Paul Zuber |
| 2012 | On line monitoring of RF power amplifiers with embedded temperature sensors. | Josep Altet, Diego Mateo, Didac Gmez |
| 2012 | Towards optimized functional evaluation of SEE-induced failures in complex designs. | Dan Alexandrescu, Enrico Costenaro |
| 2012 | Transparent structural online test for reconfigurable systems. | Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jrg Henkel, Hans-Joachim Wunderlich |
| 2011 | A BIST scheme for testing and repair of multi-mode power switches. | Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty |
| 2011 | A multi-objective optimization for memory BIST sharing using a genetic algorithm. | Lilia Zaourar, Yann Kieffer, Arnaud Wenzel |
| 2011 | Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure. | Shusuke Yoshimoto, Takuro Amashita, D. Kozuwa, Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Hiroshi Kawaguchi, Masahiko Yoshimoto |
| 2011 | Algebraic manipulation detection codes and their applications for design of secure cryptographic devices. | Zhen Wang, Mark G. Karpovsky |
| 2011 | The cost of cryptography: Is low budget possible? | Ingrid Verbauwhede |
| 2011 | Accelerating secure circuit design with hardware implementation of Diehard Battery of tests of randomness. | Anna Vaskova, Celia Lpez-Ongil, Enrique San Milln, Alejandro Jimnez-Horas, Luis Entrena |
| 2011 | Evaluation techniques for on-line testing of robust systems based on critical tasks distribution. | Anna Vaskova, Celia Lpez-Ongil, Mario Garca-Valderas, Marta Portela-Garca, Luis Entrena |