| 2006 | Low Cost Parametric Failure Diagnosis of RF Transceivers. | Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | FATE: a Functional ATPG to Traverse Unstabilized EFSMs. | Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli |
| 2006 | Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. | Shalabh Goyal, Abhijit Chatterjee, Mike Atia |
| 2006 | Testing and Diagnosis of Power Switches in SOCs. | Sandeep Kumar Goel, Maurice Meijer, Jos Pineda de Gyvez |
| 2006 | Deterministic Logic BIST for Transition Fault Testing. | Valentin Gherman, Hans-Joachim Wunderlich, Jrgen Schlffel, Michael Garbers |
| 2006 | Living with Failure: Lessons from Nature? | Steve B. Furber |
| 2006 | A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. | Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy |
| 2006 | New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). | Bill Eklow, Ben Bennetts |
| 2006 | A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2006 | On-Chip Test Generation Using Linear Subspaces. | Ramashis Das, Igor L. Markov, John P. Hayes |
| 2006 | On-Chip Time Measurement Architecture with Femtosecond Timing Resolution. | Matthew Collins, Bashir M. Al-Hashimi |
| 2006 | A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications. | Mikal Cimino, Herv Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Bgueret |
| 2006 | A Transparent based Programmable Memory BIST. | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2006 | A 22n March Test for Realistic Static Linked Faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2006 | Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. | Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes |
| 2006 | Dynamic Voltage Scaling Aware Delay Fault Testing. | Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod |
| 2005 | Evaluation of signature-based testing of RF/analog circuits. | Amir Zjajo, Jos Pineda de Gyvez |
| 2005 | A new SoC test architecture with RF/wireless connectivity. | Dan Zhao, Shambhu J. Upadhyaya, Martin Margala |
| 2005 | Design validation of behavioral VHDL descriptions for arbitrary fault models. | Fei Xin, Maciej J. Ciesielski, Ian G. Harris |
| 2005 | From embedded test to embedded diagnosis. | Hans-Joachim Wunderlich |
| 2005 | Built-in self-test of molecular electronics-based nanofabrics. | Zhanglei Wang, Krishnendu Chakrabarty |
| 2005 | Energy minimization for hybrid BIST in a system-on-chip test environment. | Raimund Ubar, Tatjana Shchenova, Gert Jervan, Zebo Peng |
| 2005 | Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. | Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee |
| 2005 | Path-oriented transition fault test generation considering operating conditions. | Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |