| 2011 | Prediction of compression bound and optimization of compression architecture for linear decompression-based schemes. | Jia Li, Yu Huang, Dong Xiang |
| 2011 | Memory-based embedded digital ATE. | Dongsoo Lee, Sang Phill Park, Ashish Goel, Kaushik Roy |
| 2011 | Advanced methods for leveraging new test standards. | Mike Laisne |
| 2011 | Apprentice - VTS edition: Season 4. | Kee Sup Kim, Rob Roy |
| 2011 | Levelized low cost delay test compaction considering IR-drop induced power supply noise. | Zhongwei Jiang, Zheng Wang, Jing Wang, D. M. H. Walker |
| 2011 | Efficient and product-representative timing model validation. | Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
| 2011 | A built-in self-test scheme for the post-bond test of TSVs in 3D ICs. | Yu-Jen Huang, Jin-Fu Li, Ji-Jan Chen, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
| 2011 | A diagnosis testbench of analog IP cores against on-chip environmental disturbances. | Takushi Hashida, Yuuki Araga, Makoto Nagata |
| 2011 | Design for Bit Error Rate estimation of high speed serial links. | Ujjwal Guin, Chen-Huan Chiang |
| 2011 | Impact of the application activity on intermittent faults in embedded systems. | Julien Guilhemsang, Olivier Hron, Nicolas Ventroux, Olivier Goncalves, Alain Giulieri |
| 2011 | Programmable extended SEC-DED codes for memory errors. | Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme |
| 2011 | Invited paper: Yin and Yang of embedded sensors for post-scaling-era. | Anne Gattiker |
| 2011 | Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutions. | Siddharth Garg, Diana Marculescu |
| 2011 | An analytical method for estimating SET propagation. | Sreenivas Gangadhar, Spyros Tragoudas |
| 2011 | Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories. | Rudrajit Datta, Nur A. Touba |
| 2011 | A scan cell architecture for inter-clock at-speed delay testing. | Kyoung Youn Cho, Rajagopalan Srinivasan |
| 2011 | Low Coverage Analysis using dynamic un-testability debug in ATPG. | Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta |
| 2011 | Harmony Widget for X-free scan testing. | Dilip K. Bhavsar |
| 2011 | Efficient trace data compression using statically selected dictionary. | Kanad Basu, Prabhat Mishra |
| 2011 | Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. | Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2011 | Enhancing online error detection through area-efficient multi-site implications. | Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal |
| 2011 | Revival of partial scan: Test cube analysis driven conversion of flip-flops. | Nader Alawadhi, Ozgur Sinanoglu |
| 2011 | An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. | Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal |
| 2010 | Low-power test planning for arbitrary at-speed delay-test clock schemes. | Christian G. Zoellin, Hans-Joachim Wunderlich |
| 2010 | Pin-count-aware online testing of digital microfluidic biochips. | Yang Zhao, Krishnendu Chakrabarty |